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Sensitivity of double-gate and FinFETDevices to process variations

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2 Author(s)
Shiying Xiong ; Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA ; Bokor, J.

Author(s)

Shiying Xiong
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Bokor, J.