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Cell based design methodology for BDD SFQ logic circuits: a high speed test and feasibility for large scale circuit applications

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7 Author(s)
Yoshikawa, N. ; Dept. of the Electr. & Comput. Eng., Yokohama Nat. Univ., Japan ; Yoda, K. ; Hoshina, H. ; Kawasaki, K.
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Author(s)

Yoshikawa, N.
Dept. of the Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
Yoda, K. ; Hoshina, H. ; Kawasaki, K. ; Fujiwara, K. ; Matsuzaki, F. ; Nakajima, N.