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Leakage power modeling and reduction with data retention

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3 Author(s)
Weiping Liao ; Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA ; Basile, J.M. ; Lei He

Author(s)

Weiping Liao
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Basile, J.M. ; Lei He