Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Intelligent space with time sensitive applications

Leung, W.-L.D.   Vanijjirattikhan, R.   Zheng Li   Le Xu   Richards, T.   Ayhan, B.   Mo-Yuen Chow  
North Carolina State Univ., Raleigh, NC;

This paper appears in: Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on
Publication Date: 24-28 July 2005
On page(s): 1413-1418
Location: Monterey, CA,
ISBN: 0-7803-9047-4
INSPEC Accession Number: 8634677
Digital Object Identifier: 10.1109/AIM.2005.1511209
Posted online: 2005-09-26 09:46:58.0

Abstract
Intelligent space (iSpace) is a relatively new concept to effectively use distributed sensors, actuators, robots, computing processors and information technology over communication networks. iSpace is a large scale mechatronics system by integrating sensors, actuators, and control algorithms in a communication system using knowledge from various engineering disciplines such as automation and control, hardware and software design, image processing, communication and networking. This paper describes a project "Johnny6 plays fetch in iSpace" to prototype an iSpace at North Carolina State University. The description includes hardware, software and networking algorithms used for this project. Different challenges such as time delay issues in the time sensitive application of iSpace is also discussed

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (285 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved