Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Combinatorial PCA and SVM methods for feature selection in learning classifications (applications to text categorization)

Anghelescu, A.V.   Muchnik, I.B.  
Dept. of Comput. Sci., Rutgers Univ., USA;

This paper appears in: Integration of Knowledge Intensive Multi-Agent Systems, 2003. International Conference on
Publication Date: 30 Sept.-4 Oct. 2003
On page(s): 491- 496
ISSN:
ISBN: 0-7803-7958-6
INSPEC Accession Number: 7906818
Digital Object Identifier: 10.1109/KIMAS.2003.1245090
Posted online: 2003-11-17 15:40:26.0

Abstract
We describe a purely combinatorial approach of obtaining meaningful representations of text data. More precisely, we describe two different methods that materialize this approach: we call them combinatorial principal component analysis (cPCA) and combinatorial support vector machines (cSVM). These names emphasise mathematical analogies between the well known PCA and SVM, on one hand, and our respective methods. For evaluating the selected spaces of features, we used the environment set for TREC 2002 and used a very common classifier: 1-nearest neighbour (1-NN). We compared the results obtained on the feature sets calculated by the procedures we described (cPCA and cSVM) with the results obtained on the original feature space. We showed that by selecting a feature space on average 50 times smaller than the original space, the performance of the classifier does not decrease by more than 2%.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (392 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved