Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Using deadbands to reduce communication in networked control systems

Otanez, P.G.   Moyne, J.R.   Tilbury, D.M.  
Dept. of Mech. Eng., Michigan Univ., Ann Arbor, MI, USA;

This paper appears in: American Control Conference, 2002. Proceedings of the 2002
Publication Date: 2002
Volume: 4,  On page(s): 3015- 3020 vol.4
ISSN: 0743-1619
ISBN: 0-7803-7298-0
INSPEC Accession Number: 7426205
Digital Object Identifier: 10.1109/ACC.2002.1025251
Posted online: 2002-11-07 17:04:28.0

Abstract
The most effective way to improve networked control systems (NCSs) performance is to reduce network traffic. By adapting a system to a network configuration, the communication medium is more efficiently used and time-delays are minimized. Adjustable deadbands are explored as a solution to reduce network traffic in NCSs. The stability of deadband control is derived and then verified via simulation. A method to determine the size of the deadbands is presented that relies on a performance metric that takes into account system response as well as network traffic. The effectiveness of deadband control with different controllers is studied as well as the effect of disturbances and plant uncertainty.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (631 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved