Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An overview of statistical learning theory

Vapnik, V.N.  
AT&T Labs-Res., Red Bank, NJ;

This paper appears in: Neural Networks, IEEE Transactions on
Publication Date: Sep 1999
Volume: 10,  Issue: 5
On page(s): 988-999
ISSN: 1045-9227
References Cited: 30
CODEN: ITNNEP
INSPEC Accession Number: 6362641
Digital Object Identifier: 10.1109/72.788640
Posted online: 2002-08-06 22:37:20.0

Abstract
Statistical learning theory was introduced in the late 1960's. Until the 1990's it was a purely theoretical analysis of the problem of function estimation from a given collection of data. In the middle of the 1990's new types of learning algorithms (called support vector machines) based on the developed theory were proposed. This made statistical learning theory not only a tool for the theoretical analysis but also a tool for creating practical algorithms for estimating multidimensional functions. This article presents a very general overview of statistical learning theory including both theoretical and algorithmic aspects of the theory. The goal of this overview is to demonstrate how the abstract learning theory established conditions for generalization which are more general than those discussed in classical statistical paradigms and how the understanding of these conditions inspired new algorithmic approaches to function estimation problems

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (280 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved