Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Nonlinear prediction of chaotic time series using support vectormachines

Mukherjee, S.   Osuna, E.   Girosi, F.  
Center for Biol. & Comput. Learning, MIT, Cambridge, MA;

This paper appears in: Neural Networks for Signal Processing [1997] VII. Proceedings of the 1997 IEEE Workshop
Publication Date: 24-26 Sep 1997
On page(s): 511-520
Meeting Date: 09/24/1997 - 09/26/1997
Location: Amelia Island, FL, USA
ISBN: 0-7803-4256-9
References Cited: 10
INSPEC Accession Number: 5739878
Digital Object Identifier: 10.1109/NNSP.1997.622433
Posted online: 2002-08-06 20:57:22.0

Abstract
A novel method for regression has been recently proposed by Vapnik et al. (1995, 1996). The technique, called support vector machine (SVM), is very well founded from the mathematical point of view and seems to provide a new insight in function approximation. We implemented the SVM and tested it on a database of chaotic time series previously used to compare the performances of different approximation techniques, including polynomial and rational approximation, local polynomial techniques, radial basis functions, and neural networks. The SVM performs better than the other approaches. We also study, for a particular time series, the variability in performance with respect to the few free parameters of SVM

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
Access this document
Full Text: PDF (468 KB)
» Buy this document now
»  Learn more about
» Learn more about
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved