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IEEE Transactions on Device and Materials Reliability

Aims & Scope

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=7298 More »

Frequency: 4

Subjects

  • Components, Circuits, Devices & Systems
  • Engineered Materials, Dielectrics & Plasmas

Contacts

Editor-in-Chief
Anthony S. Oates
Taiwan Semiconductor Mfg Co.
9 Creation Rd 1
Science Based Industrial Park
Hsinchu  300-77  300-77  Taiwan
aoates@tsmc.com
Phone:011 886 3 566 6090
Fax:011 886 3 578 1064

Publications Office Contact
Marlene James
IEEE/EDS Publications Office
445 Hoes Lane
Piscataway, NJ  08854 USA
m.james@ieee.org
Fax:+1 732-562-6831

Contacts

Editor-in-Chief
Anthony S. Oates
Taiwan Semiconductor Mfg Co.