Nanotechnology, IEEE Transactions on
The IEEE Transactions on Nanotechnology (TNANO) publishes novel and important results in engineeering at the nanoscale.
Latest Published Articles
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Nanoindentation-Induced Pop-In Effects in GaN Thin Films
May-06 2013 -
Designing LPG-OADM Based on a Finite Element Method and an Eigenmode Expansion Method
May-06 2013 -
Computing With Nonequilibrium Ratchets
May-06 2013 -
A Plasmonic MIM Frequency Diplexer
May-06 2013 -
Quantum Dot Cellular Automata Check Node Implementation for LDPC Decoders
May-06 2013
Popular Articles
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A Dual-Gate Graphene FET Model for Circuit Simulation—SPICE Implementation
May-06 2013 -
Graphene Nanoribbon FETs: Technology Exploration for Performance and Reliability
Jul-07 2011 -
Graphene Terahertz Plasmon Oscillators
Jan-14 2008 -
Investigation of the TiN Gate Electrode With Tunable Work Function and Its Application for FinFET Fabrication
Yongxun Liu ; Kijima, S. ; Sugimata, E. ; Masahara, M. ; Endo, K. ; Matsukawa, T. ; Ishii, Kenichi ; Sakamoto, Kunihiro ; Sekigawa, Toshihiro ; Yamauchi, H. ; Takanashi, Yoshifumi ; Suzuki, EiichiNov-13 2006 -
Immunity to Device Variations in a Spiking Neural Network With Memristive Nanodevices
May-06 2013
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Meet Our Editors
Editor-in-Chief
Kang L. Wang
University of California, Los Angeles
420 Westwood Plaza
Rm 66-147C, Engineering IV
Los Angeles, CA 90095-1594 90095-1594 USA
eic@tnano.org
Popular Articles (May 2013)
Includes the top 25 most frequently downloaded documents for this publication according to the most recent monthly usage statistics.Society Sponsor
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4. Investigation of the TiN Gate Electrode With Tunable Work Function and Its Application for FinFET Fabrication
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5. Immunity to Device Variations in a Spiking Neural Network With Memristive Nanodevices
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PDF (493 KB)
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6. Electrical Characteristics for Flash Memory With Germanium Nitride as the Charge-Trapping Layer
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PDF (648 KB)
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8. Design and Architectural Assessment of 3-D Resistive Memory Technologies in FPGAs
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10. Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor
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PDF (1310 KB)
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13. Precise Analytical Model for Short-Channel Quadruple-Gate Gate-All-Around MOSFET
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PDF (1365 KB)
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19. Benchmarking nanotechnology for high-performance and low-power logic transistor applications
Chau, R. ; Datta, S. ; Doczy, M. ; Doyle, B. ; Jin, B. ; Kavalieros, J. ; Majumdar, Amlan ; Metz, M. ; Radosavljevic, M. |
PDF (520 KB)
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20. Spike-Timing-Dependent Plasticity Using Biologically Realistic Action Potentials and Low-Temperature Materials
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PDF (820 KB)
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HTMLAims & Scope
The IEEE Transactions on Nanotechnology (TNANO) publishes novel and important results in engineeering at the nanoscale.
Meet Our Editors
Editor-in-Chief
Kang L. Wang
University of California, Los Angeles
420 Westwood Plaza
Rm 66-147C, Engineering IV
Los Angeles, CA 90095-1594 90095-1594 USA
eic@tnano.org
Further Links
The IEEE Transactions on Nanotechnology (TNANO) publishes novel and important results in engineeering at the nanoscale.
Aims & Scope
The IEEE Transactions on Nanotechnology (TNANO) publishes novel and important results in engineeering at the nanoscale. It focuses on nanoscale devices, systems, materials and applications, and on their underlying science. It is an interdisciplinary journal that covers all areas of nanotechnology. The hardcopy version is published bi-monthly, but accepted papers are published on the web as soon as they are submitted in final form.
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=7729 More »
Frequency: 6
ISSN: 1536-125X
Publication Details: IEEE Transactions on Nanotechnology
Published by:
Subjects
- Components, Circuits, Devices & Systems
- Computing & Processing (Hardware/Software)
Contacts
Editor-in-Chief
Kang L. Wang
University of California, Los Angeles
420 Westwood Plaza
Rm 66-147C, Engineering IV
Los Angeles, CA 90095-1594 USA
eic@tnano.org
About this Journal
Editorial Board
Content Announcements
Author Resources
Society Sponsor
Contacts
Editor-in-Chief
Kang L. Wang
University of California, Los Angeles
420 Westwood Plaza
Rm 66-147C, Engineering IV
Los Angeles, CA 90095-1594 90095-1594 USA
eic@tnano.org
