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IEEE Electron Device Letters contains articles related to the theory, design, performance and reliability of electron devices.
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Aims & Scope
IEEE Electron Device Letters contains articles related to the theory, design, performance and reliability of electron devices.
Meet Our Editors
Editor-in-Chief
Yuan Taur
University of California at San Diego, ECE
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IEEE Electron Device Letters contains articles related to the theory, design, performance and reliability of electron devices.
Aims & Scope
IEEE Electron Device Letters comprises original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes. Items are restricted to three pages and appear, on average, two months after acceptance. Please send all papers to theIEEE/EDS Publications Office.
This publication publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanotechnology, optoelectronics, photovoltaics, power ICs and micro-sensors. Items are restricted to three pages and publication time is two months from the end of the month in which the manuscript is accepted, providing the author responds immediately to all communications.
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Frequency: 12
ISSN: 0741-3106
Publication Details: IEEE Electron Device Letters
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- Components, Circuits, Devices & Systems
- Engineered Materials, Dielectrics & Plasmas
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Yuan Taur
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taur@ece.ucsd.edu
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University of California at San Diego, ECE
