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Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics
Latest Published Articles
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Acoustic wave localization in one-dimensional Fibonacci phononic structures with mirror symmetry
May-20 2013 -
Incipient piezoelectrics and electrostriction behavior in Sn-doped Bi
1/2 (Na0.82 K0.18 )1/2 TiO3 lead-free ceramicsHan, Hyoung-Su ; Jo, Wook ; Kang, Jin-Kyu ; Ahn, Chang-Won ; Won Kim, Ill ; Ahn, Kyoung-Kwan ; Lee, Jae-ShinMay-20 2013 -
Thermoelectric properties of epitaxial ScN films deposited by reactive magnetron sputtering onto MgO(001) substrates
Burmistrova, Polina V. ; Maassen, Jesse ; Favaloro, Tela ; Saha, Bivas ; Salamat, Shuaib ; Rui Koh, Yee ; Lundstrom, Mark S. ; Shakouri, Ali ; Sands, Timothy D.May-20 2013 -
The effect of carrier gas flow rate and source cell temperature on low pressure organic vapor phase deposition simulation by direct simulation Monte Carlo method
May-20 2013 -
Enhanced temperature dependent junction magnetoresistance in La
0.7 Sr0.3 MnO3 /Zn(Fe, Al)O carrier induced dilute magnetic semiconductor junctionsMay-20 2013
Popular Articles
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Experiments with an
834 m2 ring laser interferometerHurst, R.B. ; Stedman, G.E. ; Schreiber, K.U. ; Thirkettle, R.J. ; Graham, R.D. ; Rabeendran, N. ; Wells, J.-P.R.Jun-24 2009 -
Highly stable charge generation layers using caesium phosphate as n-dopants and inserting interlayers
May-31 2012 -
Low‐temperature deposition of high‐quality silicon dioxide by plasma‐enhanced chemical vapor deposition
Jul-07 2009 -
Wet thermal oxidation of Al
x Ga1-x As compoundsJul-07 2009 -
Thermal stability of NiSi
2 on high‐dose ion‐implanted (001) SiJul-07 2009
Publish in this Journal
Meet Our Editors
Editor
P. James Viccaro
Argonne National Laboratory
Review of Scientific Instruments
Applied Physics Letters
Proceedings of the IEEE
Popular Articles (March 2013)
Includes the top 25 most frequently downloaded documents for this publication according to the most recent monthly usage statistics.-
1. Experiments with an
834 m2 ring laser interferometerHurst, R.B. ; Stedman, G.E. ; Schreiber, K.U. ; Thirkettle, R.J. ; Graham, R.D. ; Rabeendran, N. ; Wells, J.-P.R.
|
PDF (590 KB)
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2. Highly stable charge generation layers using caesium phosphate as n-dopants and inserting interlayers
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PDF (704 KB)
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3. Low‐temperature deposition of high‐quality silicon dioxide by plasma‐enhanced chemical vapor deposition
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PDF (1156 KB)
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9. The study of charge carrier kinetics in semiconductors by microwave conductivity measurements. II.
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PDF (1095 KB)
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10. Growth of native oxide on a silicon surface
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PDF (1758 KB)
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11. Native oxides on Si surfaces of deep‐submicron contact‐hole bottoms
Aoto, Nahomi ; Nakamori, Masaharu ; Yamasaki, Shinya ; Hada, Hiromitsu ; Ikarashi, Nobuyuki ; Ishida, Koichi ; Teraoka, Yuden ; Nishiyama, Iwao |
PDF (1131 KB)
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12. Analyses of localized confinement potential in semiconductor strained wires and dots buried in lattice‐mismatched materials
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PDF (1161 KB)
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13. [001]-oriented nonepitaxial growth in
L10 -ordered FePt thin film bySiO2 addition and rapid thermal annealing |
PDF (1254 KB)
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15. Realistic evaluation of power losses in solar cells by using thermographic methods
|
PDF (588 KB)
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16. Plasma processing of low-k dielectrics
Baklanov, Mikhail R. ; de Marneffe, Jean-Francois ; Shamiryan, Denis ; Urbanowicz, Adam M. ; Shi, Hualiang ; Rakhimova, Tatyana V. ; Huang, Huai ; Ho, Paul S. |
PDF (6581 KB)
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17. Effect of hydrogen incorporation on the negative bias illumination stress instability in amorphous In-Ga-Zn-O thin-film-transistors
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PDF (2774 KB)
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18. Mechanisms involved in HBr and Ar cure plasma treatments applied to 193 nm photoresists
Pargon, E. ; Menguelti, K. ; Martin, M. ; Bazin, A. ; Chaix-Pluchery, O. ; Sourd, C. ; Derrough, S. ; Lill, T. ; Joubert, O. |
PDF (542 KB)
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20. Ink-jet printing of carbon nanotube thin film transistors
Beecher, P. ; Servati, P. ; Rozhin, A. ; Colli, A. ; Scardaci, V. ; Pisana, S. ; Hasan, T. ; Flewitt, A.J. ; Robertson, J. ; Hsieh, G.W. ; Li, F.M. ; Nathan, A. ; Ferrari, A.C. ; Milne, W.I. |
PDF (255 KB)
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21. Stresses, curvatures, and shape changes arising from patterned lines on silicon wafers
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PDF (4233 KB)
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22. Temperature and doping-dependent resistivity of Ti/Au/Pd/Au multilayer ohmic contact to n-GaN
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PDF (93 KB)
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23. Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
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PDF (593 KB)
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24. Effects of shapes and orientations of scatterers and lattice symmetries on the photonic band gap in two-dimensional photonic crystals
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PDF (698 KB)
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25. Damage‐free selective etching of Si native oxides using NH
3 /NF3 and SF6 /H2 O down‐flow etching |
PDF (457 KB)
Aims & Scope
Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics
Meet Our Editors
Editor
P. James Viccaro
Argonne National Laboratory
Further Links
Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics
Aims & Scope
Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics; content is published online daily, collected into two online and printed issues per month (24 issues per year). The journal publishes articles that emphasize understanding of the physics underlying modern technology, but distinguished from technology on the one side and pure physics on the other. Applied Physics Reviews is a series of occasional review articles on topics within this scope. The Proceedings of the Conference on Magnetism and Magnetic Materials is an annual feature.
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=4915369 More »
Frequency: 24
ISSN: 0021-8979
Subjects
- Aerospace
- Bioengineering
- Components, Circuits, Devices & Systems
- Computing & Processing (Hardware/Software)
- General Topics for Engineers (Math, Science & Engineering)
- Photonics & Electro-Optics
- Power, Energy, & Industry Applications
- Signal Processing & Analysis
Contacts
Editor
P. James Viccaro
Argonne National Laboratory
Building 203, Room A-106
9700 South Cass Avenue
Argonne, IL 60439 60439 USA
jap@anl.gov
Phone:630-252-8700
Fax:630-252-8711
Contacts
Editor
P. James Viccaro
Argonne National Laboratory
