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Applied Physics Letters, published by the American Institute of Physics, features concise, up-to-date reports on significant new findings in applied physics.
Latest Published Articles
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Depth resolved studies of SrTiO
3 defects using x-ray excited optical luminescence and cathodoluminescenceRosenberg, R.A. ; Choi, Y. ; Vijayalakshmi, K. ; Kareev, M. ; Tchakhalian, J. ; Balaz, Snjezana ; Brillson, L.J.May-20 2013 -
Ultra-smooth epitaxial Ge grown on Si(001) utilizing a thin C-doped Ge buffer layer
May-20 2013 -
Chemical identification of luminescence due to Sn and Sb in ZnO
May-20 2013 -
Theoretical model of superconducting spintronic SIsFS devices
Bakurskiy, S.V. ; Klenov, N.V. ; Soloviev, I.I. ; Bol'ginov, V.V. ; Ryazanov, V.V. ; Vernik, I.V. ; Mukhanov, O.A. ; Kupriyanov, M.Yu. ; Golubov, A.A.May-20 2013 -
Effect of polarization on intersubband transition in AlGaN/GaN multiple quantum wells
Chen, G. ; Li, Z.L. ; Wang, X.Q. ; Huang, C.C. ; Rong, X. ; Sang, L.W. ; Xu, F.J. ; Tang, N. ; Qin, Z.X. ; Sumiya, M. ; Chen, Y.H. ; Ge, W.K. ; Shen, B.May-20 2013
Popular Articles
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Making graphene visible
Blake, P. ; Hill, E.W. ; Castro Neto, A.H. ; Novoselov, K.S. ; Jiang, D. ; Yang, R. ; Booth, T.J. ; Geim, A.K.Jun-18 2009 -
Raman fingerprint of charged impurities in graphene
Jun-18 2009 -
Carbon nanotube films prepared by thermal chemical vapor deposition at low temperature for field emission applications
Jun-18 2009 -
Waveguiding effects in laser‐induced aqueous etching of semiconductors
Jun-18 2009 -
Macroscale refrigeration by nanoscale electron transport
Mar-07 2013
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Meet Our Editors
Editor
Nghi Q. Lam
Argonne National Laboratory
Review of Scientific Instruments
Proceedings of the IEEE
Journal of Applied Physics
Popular Articles (March 2013)
Includes the top 25 most frequently downloaded documents for this publication according to the most recent monthly usage statistics.-
1. Making graphene visible
Blake, P. ; Hill, E.W. ; Castro Neto, A.H. ; Novoselov, K.S. ; Jiang, D. ; Yang, R. ; Booth, T.J. ; Geim, A.K.
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PDF (248 KB)
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3. Carbon nanotube films prepared by thermal chemical vapor deposition at low temperature for field emission applications
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PDF (525 KB)
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6. Tribological and electrical properties of metal‐containing hydrogenated carbon films
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PDF (388 KB)
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8. Ultralong minority‐carrier lifetime epitaxial GaAs by photon recycling
Ahrenkiel, R.K. ; Dunlavy, D.J. ; Keyes, Brian ; Vernon, S.M. ; Dixon, T.M. ; Tobin, S.P. ; Miller, K.L. ; Hayes, R.E. |
PDF (458 KB)
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9. Improved cathode buffer layer to decrease exciton recombination in organic planar heterojunction solar cells
Verreet, Bregt ; Malinowski, Pawel E. ; Niesen, Bjoern ; Cheyns, David ; Heremans, Paul ; Stesmans, Andre ; Rand, Barry P. |
PDF (557 KB)
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11. Low-temperature formation of silicon nitride gate dielectrics by atomic-layer deposition
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PDF (78 KB)
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13. Nucleation mechanism of dislocation half-loop arrays in
4H -silicon carbide homoepitaxial layers |
PDF (427 KB)
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14. Kinetics of silicon epitaxy using SiH
4 in a rapid thermal chemical vapor deposition reactor |
PDF (551 KB)
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16. Effect of three-dimensional current and temperature distributions on void formation and propagation in flip-chip solder joints during electromigration
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PDF (215 KB)
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19. Low Schottky barrier height for silicides on
n -type Si (100) by interfacial selenium segregation during silicidation |
PDF (443 KB)
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20. Observation of stacking faults from basal plane dislocations in highly doped 4H-SiC epilayers
Mahadik, Nadeemullah A. ; Stahlbush, Robert E. ; Ancona, M.G. ; Imhoff, E.A. ; Hobart, K.D. ; Myers-Ward, Rachael L. ; Eddy, C.R. ; Kurt Gaskill, D. ; Kub, Fritz J. |
PDF (1176 KB)
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21. Invasion percolation model for abnormal time-dependent dielectric breakdown characteristic of low-k dielectrics due to massive metallic diffusion
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PDF (980 KB)
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22. Correlation between Ti source/drain contact and performance of InGaZnO-based thin film transistors
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PDF (1051 KB)
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23. High performance InGaZnO thin film transistor with InGaZnO source and drain electrodes
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PDF (785 KB)
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24. Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas ; Florakis, Antonios ; Hantschel, Thomas ; Eyben, Pierre ; Verhulst, Anne S. ; Rooyackers, Rita ; Vandooren, Anne ; Vandervorst, W. |
PDF (1417 KB)
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Aims & Scope
Applied Physics Letters, published by the American Institute of Physics, features concise, up-to-date reports on significant new findings in applied physics.
Meet Our Editors
Editor
Nghi Q. Lam
Argonne National Laboratory
Further Links
Applied Physics Letters, published by the American Institute of Physics, features concise, up-to-date reports on significant new findings in applied physics.
Aims & Scope
Applied Physics Letters, published by the American Institute of Physics, features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, Applied Physics Letters offers prompt publication of new experimental and theoretical papers bearing on applications of physics phenomena to all branches of science, engineering, and modern technology. Content is published online daily, collected into weekly online and printed issues (52 issues per year).
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=4816218 More »
Frequency: 52
ISSN: 0003-6951
Subjects
- Bioengineering
- Components, Circuits, Devices & Systems
- Engineered Materials, Dielectrics & Plasmas
- Fields, Waves & Electromagnetics
- General Topics for Engineers (Math, Science & Engineering)
- Photonics & Electro-Optics
- Power, Energy, & Industry Applications
Contacts
Editor
Nghi Q. Lam
Argonne National Laboratory
Building 203,Room R-127
9700 South Cass Avenue
Argonne, IL 60439-4843 60439-4843 USA
apl@anl.gov
Phone:630-252-4200
Fax:630-252-4973
About this Journal
Author Resources
Contacts
Editor
Nghi Q. Lam
Argonne National Laboratory
