Solid-State Circuits, IEEE Journal of
- Vol: 43 Issue: 12
- Vol: 43 Issue: 11
- Vol: 43 Issue: 10
- Vol: 43 Issue: 9
- Vol: 43 Issue: 8
- Vol: 43 Issue: 7
- Vol: 43 Issue: 6
- Vol: 43 Issue: 5
- Vol: 43 Issue: 4
- Vol: 43 Issue: 3
- Vol: 43 Issue: 2
- Vol: 43 Issue: 1
- Vol: 44 Issue: 12
- Vol: 44 Issue: 11
- Vol: 44 Issue: 10
- Vol: 44 Issue: 9
- Vol: 44 Issue: 8
- Vol: 44 Issue: 7
- Vol: 44 Issue: 6
- Vol: 44 Issue: 5
- Vol: 44 Issue: 4
- Vol: 44 Issue: 3
- Vol: 44 Issue: 2
- Vol: 44 Issue: 1
- Vol: 41 Issue: 12
- Vol: 41 Issue: 11
- Vol: 41 Issue: 10
- Vol: 41 Issue: 9
- Vol: 41 Issue: 8
- Vol: 41 Issue: 7
- Vol: 41 Issue: 6
- Vol: 41 Issue: 5
- Vol: 41 Issue: 4
- Vol: 41 Issue: 3
- Vol: 41 Issue: 2
- Vol: 41 Issue: 1
- Vol: 42 Issue: 12
- Vol: 42 Issue: 11
- Vol: 42 Issue: 10
- Vol: 42 Issue: 9
- Vol: 42 Issue: 8
- Vol: 42 Issue: 7
- Vol: 42 Issue: 6
- Vol: 42 Issue: 5
- Vol: 42 Issue: 4
- Vol: 42 Issue: 3
- Vol: 42 Issue: 2
- Vol: 42 Issue: 1
- Vol: 39 Issue: 12
- Vol: 39 Issue: 11
- Vol: 39 Issue: 10
- Vol: 39 Issue: 9
- Vol: 39 Issue: 8
- Vol: 39 Issue: 7
- Vol: 39 Issue: 6
- Vol: 39 Issue: 5
- Vol: 39 Issue: 4
- Vol: 39 Issue: 3
- Vol: 39 Issue: 2
- Vol: 39 Issue: 1
- Vol: 40 Issue: 12
- Vol: 40 Issue: 11
- Vol: 40 Issue: 10
- Vol: 40 Issue: 9
- Vol: 40 Issue: 8
- Vol: 40 Issue: 7
- Vol: 40 Issue: 6
- Vol: 40 Issue: 5
- Vol: 40 Issue: 4
- Vol: 40 Issue: 3
- Vol: 40 Issue: 2
- Vol: 40 Issue: 1
- Vol: 37 Issue: 12
- Vol: 37 Issue: 11
- Vol: 37 Issue: 10
- Vol: 37 Issue: 9
- Vol: 37 Issue: 8
- Vol: 37 Issue: 7
- Vol: 37 Issue: 6
- Vol: 37 Issue: 5
- Vol: 37 Issue: 4
- Vol: 37 Issue: 3
- Vol: 37 Issue: 2
- Vol: 37 Issue: 1
- Vol: 38 Issue: 12
- Vol: 38 Issue: 11
- Vol: 38 Issue: 10
- Vol: 38 Issue: 9
- Vol: 38 Issue: 8
- Vol: 38 Issue: 7
- Vol: 38 Issue: 6
- Vol: 38 Issue: 5
- Vol: 38 Issue: 4
- Vol: 38 Issue: 3
- Vol: 38 Issue: 2
- Vol: 38 Issue: 1
- Vol: 30 Issue: 12
- Vol: 30 Issue: 11
- Vol: 30 Issue: 10
- Vol: 30 Issue: 9
- Vol: 30 Issue: 8
- Vol: 30 Issue: 7
- Vol: 30 Issue: 6
- Vol: 30 Issue: 5
- Vol: 30 Issue: 4
- Vol: 30 Issue: 3
- Vol: 30 Issue: 2
- Vol: 30 Issue: 1
- Vol: 31 Issue: 12
- Vol: 31 Issue: 11
- Vol: 31 Issue: 10
- Vol: 31 Issue: 9
- Vol: 31 Issue: 8
- Vol: 31 Issue: 7
- Vol: 31 Issue: 6
- Vol: 31 Issue: 5
- Vol: 31 Issue: 4
- Vol: 31 Issue: 3
- Vol: 31 Issue: 2
- Vol: 31 Issue: 1
- Vol: 32 Issue: 12
- Vol: 32 Issue: 11
- Vol: 32 Issue: 10
- Vol: 32 Issue: 9
- Vol: 32 Issue: 8
- Vol: 32 Issue: 7
- Vol: 32 Issue: 6
- Vol: 32 Issue: 5
- Vol: 32 Issue: 4
- Vol: 32 Issue: 3
- Vol: 32 Issue: 2
- Vol: 32 Issue: 1
- Vol: 33 Issue: 12
- Vol: 33 Issue: 11
- Vol: 33 Issue: 10
- Vol: 33 Issue: 9
- Vol: 33 Issue: 8
- Vol: 33 Issue: 7
- Vol: 33 Issue: 6
- Vol: 33 Issue: 5
- Vol: 33 Issue: 4
- Vol: 33 Issue: 3
- Vol: 33 Issue: 2
- Vol: 33 Issue: 1
- Vol: 26 Issue: 12
- Vol: 26 Issue: 11
- Vol: 26 Issue: 10
- Vol: 26 Issue: 9
- Vol: 26 Issue: 8
- Vol: 26 Issue: 7
- Vol: 26 Issue: 6
- Vol: 26 Issue: 5
- Vol: 26 Issue: 4
- Vol: 26 Issue: 3
- Vol: 26 Issue: 2
- Vol: 26 Issue: 1
- Vol: 27 Issue: 12
- Vol: 27 Issue: 11
- Vol: 27 Issue: 10
- Vol: 27 Issue: 9
- Vol: 27 Issue: 8
- Vol: 27 Issue: 7
- Vol: 27 Issue: 6
- Vol: 27 Issue: 5
- Vol: 27 Issue: 4
- Vol: 27 Issue: 3
- Vol: 27 Issue: 2
- Vol: 27 Issue: 1
- Vol: 10 Issue: 6
- Vol: 10 Issue: 5
- Vol: 10 Issue: 4
- Vol: 10 Issue: 3
- Vol: 10 Issue: 2
- Vol: 10 Issue: 1
- Vol: 28 Issue: 12
- Vol: 28 Issue: 11
- Vol: 28 Issue: 10
- Vol: 28 Issue: 9
- Vol: 28 Issue: 8
- Vol: 28 Issue: 7
- Vol: 28 Issue: 6
- Vol: 28 Issue: 5
- Vol: 28 Issue: 4
- Vol: 28 Issue: 3
- Vol: 28 Issue: 2
- Vol: 28 Issue: 1
- Vol: 11 Issue: 6
- Vol: 11 Issue: 5
- Vol: 11 Issue: 4
- Vol: 11 Issue: 3
- Vol: 11 Issue: 2
- Vol: 11 Issue: 1
- Vol: 29 Issue: 12
- Vol: 29 Issue: 11
- Vol: 29 Issue: 10
- Vol: 29 Issue: 9
- Vol: 29 Issue: 8
- Vol: 29 Issue: 7
- Vol: 29 Issue: 6
- Vol: 29 Issue: 5
- Vol: 29 Issue: 4
- Vol: 29 Issue: 3
- Vol: 29 Issue: 2
- Vol: 29 Issue: 1
- Vol: 12 Issue: 6
- Vol: 12 Issue: 5
- Vol: 12 Issue: 4
- Vol: 12 Issue: 3
- Vol: 12 Issue: 2
- Vol: 12 Issue: 1
- Vol: 47 Issue: 12
- Vol: 47 Issue: 11
- Vol: 47 Issue: 10
- Vol: 47 Issue: 9
- Vol: 47 Issue: 8
- Vol: 47 Issue: 7
- Vol: 47 Issue: 6
- Vol: 47 Issue: 5
- Vol: 47 Issue: 4
- Vol: 47 Issue: 3
- Vol: 47 Issue: 2
- Vol: 47 Issue: 1
- Vol: 13 Issue: 6
- Vol: 13 Issue: 5
- Vol: 13 Issue: 4
- Vol: 13 Issue: 3
- Vol: 13 Issue: 2
- Vol: 13 Issue: 1
- Vol: 46 Issue: 12
- Vol: 46 Issue: 11
- Vol: 46 Issue: 10
- Vol: 46 Issue: 9
- Vol: 46 Issue: 8
- Vol: 46 Issue: 7
- Vol: 46 Issue: 6
- Vol: 46 Issue: 5
- Vol: 46 Issue: 4
- Vol: 46 Issue: 3
- Vol: 46 Issue: 2
- Vol: 46 Issue: 1
- Vol: 14 Issue: 6
- Vol: 14 Issue: 5
- Vol: 14 Issue: 4
- Vol: 14 Issue: 3
- Vol: 14 Issue: 2
- Vol: 14 Issue: 1
- Vol: 45 Issue: 12
- Vol: 45 Issue: 11
- Vol: 45 Issue: 10
- Vol: 45 Issue: 9
- Vol: 45 Issue: 8
- Vol: 45 Issue: 7
- Vol: 45 Issue: 6
- Vol: 45 Issue: 5
- Vol: 45 Issue: 4
- Vol: 45 Issue: 3
- Vol: 45 Issue: 2
- Vol: 45 Issue: 1
- Vol: 34 Issue: 12
- Vol: 34 Issue: 11
- Vol: 34 Issue: 10
- Vol: 34 Issue: 9
- Vol: 34 Issue: 8
- Vol: 34 Issue: 7
- Vol: 34 Issue: 6
- Vol: 34 Issue: 5
- Vol: 34 Issue: 4
- Vol: 34 Issue: 3
- Vol: 34 Issue: 2
- Vol: 34 Issue: 1
- Vol: 25 Issue: 6
- Vol: 25 Issue: 5
- Vol: 25 Issue: 4
- Vol: 25 Issue: 3
- Vol: 25 Issue: 2
- Vol: 25 Issue: 1
- Vol: 17 Issue: 6
- Vol: 17 Issue: 5
- Vol: 17 Issue: 4
- Vol: 17 Issue: 3
- Vol: 17 Issue: 2
- Vol: 17 Issue: 1
- Vol: 18 Issue: 6
- Vol: 18 Issue: 5
- Vol: 18 Issue: 4
- Vol: 18 Issue: 3
- Vol: 18 Issue: 2
- Vol: 18 Issue: 1
- Vol: 15 Issue: 6
- Vol: 15 Issue: 5
- Vol: 15 Issue: 4
- Vol: 15 Issue: 3
- Vol: 15 Issue: 2
- Vol: 15 Issue: 1
- Vol: 16 Issue: 6
- Vol: 16 Issue: 5
- Vol: 16 Issue: 4
- Vol: 16 Issue: 3
- Vol: 16 Issue: 2
- Vol: 16 Issue: 1
- Vol: 21 Issue: 6
- Vol: 21 Issue: 5
- Vol: 21 Issue: 4
- Vol: 21 Issue: 3
- Vol: 21 Issue: 2
- Vol: 21 Issue: 1
- Vol: 22 Issue: 6
- Vol: 22 Issue: 5
- Vol: 22 Issue: 4
- Vol: 22 Issue: 3
- Vol: 22 Issue: 2
- Vol: 22 Issue: 1
- Vol: 19 Issue: 6
- Vol: 19 Issue: 5
- Vol: 19 Issue: 4
- Vol: 19 Issue: 3
- Vol: 19 Issue: 2
- Vol: 19 Issue: 1
- Vol: 20 Issue: 6
- Vol: 20 Issue: 5
- Vol: 20 Issue: 4
- Vol: 20 Issue: 3
- Vol: 20 Issue: 2
- Vol: 20 Issue: 1
- Vol: 23 Issue: 6
- Vol: 23 Issue: 5
- Vol: 23 Issue: 4
- Vol: 23 Issue: 3
- Vol: 23 Issue: 2
- Vol: 23 Issue: 1
- Vol: 24 Issue: 6
- Vol: 24 Issue: 5
- Vol: 24 Issue: 4
- Vol: 24 Issue: 3
- Vol: 24 Issue: 2
- Vol: 24 Issue: 1
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits.
Latest Published Articles
-
A Wideband Receiver With Resonant Multi-Phase LO and Current Reuse Harmonic Rejection Baseband
Apr-19 2013 -
A Linearized, Low-Phase-Noise VCO-Based 25-GHz PLL With Autonomic Biasing
Sadhu, B. ; Ferriss, M.A. ; Natarajan, A.S. ; Yaldiz, S. ; Plouchart, J.-O. ; Rylyakov, A.V. ; Valdes-Garcia, A. ; Parker, B.D. ; Babakhani, A. ; Reynolds, S. ; Li, X. ; Pileggi, L. ; Harjani, R. ; Tierno, J.A. ; Friedman, D.Apr-19 2013 -
Analysis and Design of a 5 GS/s Analog Charge-Domain FFT for an SDR Front-End in 65 nm CMOS
Apr-19 2013 -
Post-Si Programmable ESD Protection Circuit Design: Mechanisms and Analysis
Wang, X. ; Shi, Z. ; Liu, J. ; Lin, L. ; Zhao, H. ; Wang, L. ; Ma, R. ; Zhang, C. ; Dong, Z. ; Fan, S. ; Tang, H. ; Wang, A. ; Cheng, Y. ; Zhao, B. ; Zhang, Z. ; Chi, B. ; Ren, T.-L.Apr-19 2013 -
A 70–100 GHz Direct-Conversion Transmitter and Receiver Phased Array Chipset Demonstrating 10 Gb/s Wireless Link
Apr-19 2013
Popular Articles
-
A Push–Pull Class-C CMOS VCO
Feb-20 2013 -
A Harmonic-Rejecting CMOS LNA for Broadband Radios
Mar-22 2013 -
A 25-Gb/s 5-mW CMOS CDR/Deserializer
Feb-20 2013 -
A 2.8–3.2-GHz Fractional-
Feb-20 2013 -
A 10-Bit 300-MS/s Pipelined ADC With Digital Calibration and Digital Bias Generation
Feb-20 2013
Publish in this Journal
Meet Our Editors
Editor-in-Chief
Un-Ku Moon
Oregon State University, EECS
Related Journals
IEEE Access
Proceedings of the IEEE
Solid-State Circuits Magazine, IEEE
Popular Articles (March 2013)
Includes the top 25 most frequently downloaded documents for this publication according to the most recent monthly usage statistics.Society Sponsor
-
-
-
-
4. A 2.8–3.2-GHz Fractional-
|
PDF (2907 KB)
-
5. A 10-Bit 300-MS/s Pipelined ADC With Digital Calibration and Digital Bias Generation
|
PDF (2315 KB)
-
-
7. A 0.4-mW/Gb/s Near-Ground Receiver Front-End With Replica Transconductance Termination Calibration for a 16-Gb/s Source-Series Terminated Transceiver
Kaviani, K. ; Amirkhany, A. ; Huang, C. ; Phuong Le ; Beyene, W.T. ; Madden, C. ; Saito, K. ; Sano, K. ; Murugan, V.I. ; Kun-Yung Ken Chang ; Yuan, X.C. |
PDF (2868 KB)
-
-
9. A 2.8 GS/s 44.6 mW Time-Interleaved ADC Achieving 50.9 dB SNDR and 3 dB Effective Resolution Bandwidth of 1.5 GHz in 65 nm CMOS
|
PDF (2620 KB)
-
-
11. An Integral Path Self-Calibration Scheme for a Dual-Loop PLL
Ferriss, M. ; Plouchart, J.-O. ; Natarajan, A. ; Rylyakov, A. ; Parker, B. ; Tierno, J. ; Babakhani, A. ; Yaldiz, S. ; Valdes-Garcia, A. ; Sadhu, B. ; Friedman, D. |
PDF (3117 KB)
-
-
13. A Low Quiescent Current Asynchronous Digital-LDO With PLL-Modulated Fast-DVS Power Management in 40 nm SoC for MIPS Performance Improvement
Lee, Y.-H. ; Peng, S.-Y. ; Chiu, C.-C. ; Wu, A.C.-H. ; Chen, K.-H. ; Lin, Y.-H. ; Wang, S.-W. ; Tsai, T.-Y. ; Huang, C.-C. ; Lee, C.-C. |
PDF (3070 KB)
-
-
-
16. A 7 bit, 3.75 ps Resolution Two-Step Time-to-Digital Converter in 65 nm CMOS Using Pulse-Train Time Amplifier
|
PDF (2047 KB)
-
17. Matching properties of MOS transistors
|
PDF (912 KB)
-
18. A capacitor-free CMOS low-dropout regulator with damping-factor-control frequency compensation
|
PDF (897 KB)
-
-
-
21. A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of
-
22. Immediate Calibration of Operational Amplifier Gain Error in Pipelined ADCs Using Extended Correlated Double Sampling
|
PDF (1820 KB)
-
-
24. Full Four-Channel 6.3-Gb/s 60-GHz CMOS Transceiver With Low-Power Analog and Digital Baseband Circuitry
Okada, K. ; Kondou, K. ; Miyahara, M. ; Shinagawa, M. ; Asada, H. ; Minami, R. ; Yamaguchi, T. ; Musa, A. ; Tsukui, Y. ; Asakura, Y. ; Tamonoki, S. ; Yamagishi, H. ; Hino, Y. ; Sato, T. ; Sakaguchi, H. ; Shimasaki, N. ; Ito, T. ; Takeuchi, Y. ; Li, N. ; Bu, Q. ; Murakami, R. ; Bunsen, K. ; Matsushita, K. ; Noda, M. ; Matsuzawa, A.
-
HTML
Aims & Scope
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits.
Meet Our Editors
Editor-in-Chief
Un-Ku Moon
Oregon State University, EECS
Further Links
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits.
Aims & Scope
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=4 More »
Frequency: 12
Publication Details: IEEE Journal of Solid-State Circuits
Subjects
- Components, Circuits, Devices & Systems
- Engineered Materials, Dielectrics & Plasmas
Contacts
Editor-in-Chief
Un-Ku Moon
Oregon State University, EECS
1148 Kelley Engineering
Corvallis, OR 97331-8600 USA
jssc@eecs.oregonstate.edu
Phone:+1 541 737 2051
About this Journal
Editorial Board
Content Announcements
Author Resources
Society Sponsor
Contacts
Editor-in-Chief
Un-Ku Moon
Oregon State University, EECS
