Pattern Analysis and Machine Intelligence, IEEE Transactions on
- Vol: 30 Issue: 1
- Vol: 30 Issue: 2
- Vol: 30 Issue: 3
- Vol: 30 Issue: 4
- Vol: 30 Issue: 5
- Vol: 30 Issue: 6
- Vol: 30 Issue: 7
- Vol: 30 Issue: 8
- Vol: 30 Issue: 9
- Vol: 30 Issue: 10
- Vol: 30 Issue: 11
- Vol: 30 Issue: 12
- Vol: 31 Issue: 1
- Vol: 31 Issue: 2
- Vol: 31 Issue: 3
- Vol: 31 Issue: 4
- Vol: 31 Issue: 5
- Vol: 31 Issue: 6
- Vol: 31 Issue: 7
- Vol: 31 Issue: 8
- Vol: 31 Issue: 9
- Vol: 31 Issue: 10
- Vol: 31 Issue: 11
- Vol: 31 Issue: 12
- Vol: 28 Issue: 1
- Vol: 28 Issue: 2
- Vol: 28 Issue: 3
- Vol: 28 Issue: 4
- Vol: 28 Issue: 5
- Vol: 28 Issue: 6
- Vol: 28 Issue: 7
- Vol: 28 Issue: 8
- Vol: 28 Issue: 9
- Vol: 28 Issue: 10
- Vol: 28 Issue: 11
- Vol: 28 Issue: 12
- Vol: 29 Issue: 1
- Vol: 29 Issue: 2
- Vol: 29 Issue: 3
- Vol: 29 Issue: 4
- Vol: 29 Issue: 5
- Vol: 29 Issue: 6
- Vol: 29 Issue: 7
- Vol: 29 Issue: 8
- Vol: 29 Issue: 9
- Vol: 29 Issue: 10
- Vol: 29 Issue: 11
- Vol: 29 Issue: 12
- Vol: 26 Issue: 1
- Vol: 26 Issue: 2
- Vol: 26 Issue: 3
- Vol: 26 Issue: 4
- Vol: 26 Issue: 5
- Vol: 26 Issue: 6
- Vol: 26 Issue: 7
- Vol: 26 Issue: 8
- Vol: 26 Issue: 9
- Vol: 26 Issue: 10
- Vol: 26 Issue: 11
- Vol: 26 Issue: 12
- Vol: 27 Issue: 1
- Vol: 27 Issue: 2
- Vol: 27 Issue: 3
- Vol: 27 Issue: 4
- Vol: 27 Issue: 5
- Vol: 27 Issue: 6
- Vol: 27 Issue: 7
- Vol: 27 Issue: 8
- Vol: 27 Issue: 9
- Vol: 27 Issue: 10
- Vol: 27 Issue: 11
- Vol: 27 Issue: 12
- Vol: 24 Issue: 1
- Vol: 24 Issue: 2
- Vol: 24 Issue: 3
- Vol: 24 Issue: 4
- Vol: 24 Issue: 5
- Vol: 24 Issue: 6
- Vol: 24 Issue: 7
- Vol: 24 Issue: 8
- Vol: 24 Issue: 9
- Vol: 24 Issue: 10
- Vol: 24 Issue: 11
- Vol: 24 Issue: 12
- Vol: 25 Issue: 1
- Vol: 25 Issue: 2
- Vol: 25 Issue: 3
- Vol: 25 Issue: 4
- Vol: 25 Issue: 5
- Vol: 25 Issue: 6
- Vol: 25 Issue: 7
- Vol: 25 Issue: 8
- Vol: 25 Issue: 9
- Vol: 25 Issue: 10
- Vol: 25 Issue: 11
- Vol: 25 Issue: 12
- Vol: 17 Issue: 1
- Vol: 17 Issue: 2
- Vol: 17 Issue: 3
- Vol: 17 Issue: 4
- Vol: 17 Issue: 5
- Vol: 17 Issue: 6
- Vol: 17 Issue: 7
- Vol: 17 Issue: 8
- Vol: 17 Issue: 9
- Vol: 17 Issue: 10
- Vol: 17 Issue: 11
- Vol: 17 Issue: 12
- Vol: 18 Issue: 1
- Vol: 18 Issue: 2
- Vol: 18 Issue: 3
- Vol: 18 Issue: 4
- Vol: 18 Issue: 5
- Vol: 18 Issue: 6
- Vol: 18 Issue: 7
- Vol: 18 Issue: 8
- Vol: 18 Issue: 9
- Vol: 18 Issue: 10
- Vol: 18 Issue: 11
- Vol: 18 Issue: 12
- Vol: 19 Issue: 1
- Vol: 19 Issue: 2
- Vol: 19 Issue: 3
- Vol: 19 Issue: 4
- Vol: 19 Issue: 5
- Vol: 19 Issue: 6
- Vol: 19 Issue: 7
- Vol: 19 Issue: 8
- Vol: 19 Issue: 9
- Vol: 19 Issue: 10
- Vol: 19 Issue: 11
- Vol: 19 Issue: 12
- Vol: 20 Issue: 1
- Vol: 20 Issue: 2
- Vol: 20 Issue: 3
- Vol: 20 Issue: 4
- Vol: 20 Issue: 5
- Vol: 20 Issue: 6
- Vol: 20 Issue: 7
- Vol: 20 Issue: 8
- Vol: 20 Issue: 9
- Vol: 20 Issue: 10
- Vol: 20 Issue: 11
- Vol: 20 Issue: 12
- Vol: 13 Issue: 1
- Vol: 13 Issue: 2
- Vol: 13 Issue: 3
- Vol: 13 Issue: 4
- Vol: 13 Issue: 5
- Vol: 13 Issue: 6
- Vol: 13 Issue: 7
- Vol: 13 Issue: 8
- Vol: 13 Issue: 9
- Vol: 13 Issue: 10
- Vol: 13 Issue: 11
- Vol: 13 Issue: 12
- Vol: 14 Issue: 1
- Vol: 14 Issue: 2
- Vol: 14 Issue: 3
- Vol: 14 Issue: 4
- Vol: 14 Issue: 5
- Vol: 14 Issue: 6
- Vol: 14 Issue: 7
- Vol: 14 Issue: 8
- Vol: 14 Issue: 9
- Vol: 14 Issue: 10
- Vol: 14 Issue: 11
- Vol: 14 Issue: 12
- Vol: 15 Issue: 1
- Vol: 15 Issue: 2
- Vol: 15 Issue: 3
- Vol: 15 Issue: 4
- Vol: 15 Issue: 5
- Vol: 15 Issue: 6
- Vol: 15 Issue: 7
- Vol: 15 Issue: 8
- Vol: 15 Issue: 9
- Vol: 15 Issue: 10
- Vol: 15 Issue: 11
- Vol: 15 Issue: 12
- Vol: 16 Issue: 1
- Vol: 16 Issue: 2
- Vol: 16 Issue: 3
- Vol: 16 Issue: 4
- Vol: 16 Issue: 5
- Vol: 16 Issue: 6
- Vol: 16 Issue: 7
- Vol: 16 Issue: 8
- Vol: 16 Issue: 9
- Vol: 16 Issue: 10
- Vol: 16 Issue: 11
- Vol: 16 Issue: 12
- Vol: 34 Issue: 1
- Vol: 34 Issue: 2
- Vol: 34 Issue: 3
- Vol: 34 Issue: 4
- Vol: 34 Issue: 5
- Vol: 34 Issue: 6
- Vol: 34 Issue: 7
- Vol: 34 Issue: 8
- Vol: 34 Issue: 9
- Vol: 34 Issue: 10
- Vol: 34 Issue: 11
- Vol: 34 Issue: 12
- Vol: 33 Issue: 1
- Vol: 33 Issue: 2
- Vol: 33 Issue: 3
- Vol: 33 Issue: 4
- Vol: 33 Issue: 5
- Vol: 33 Issue: 6
- Vol: 33 Issue: 7
- Vol: 33 Issue: 8
- Vol: 33 Issue: 9
- Vol: 33 Issue: 10
- Vol: 33 Issue: 11
- Vol: 33 Issue: 12
- Vol: 32 Issue: 1
- Vol: 32 Issue: 2
- Vol: 32 Issue: 3
- Vol: 32 Issue: 4
- Vol: 32 Issue: 5
- Vol: 32 Issue: 6
- Vol: 32 Issue: 7
- Vol: 32 Issue: 8
- Vol: 32 Issue: 9
- Vol: 32 Issue: 10
- Vol: 32 Issue: 11
- Vol: 32 Issue: 12
- Vol: 21 Issue: 1
- Vol: 21 Issue: 2
- Vol: 21 Issue: 3
- Vol: 21 Issue: 4
- Vol: 21 Issue: 5
- Vol: 21 Issue: 6
- Vol: 21 Issue: 7
- Vol: 21 Issue: 8
- Vol: 21 Issue: 9
- Vol: 21 Issue: 10
- Vol: 21 Issue: 11
- Vol: 21 Issue: 12
- Vol: 35 Issue: 1
- Vol: 35 Issue: 2
- Vol: 35 Issue: 3
- Vol: 35 Issue: 4
- Vol: 35 Issue: 5
- Vol: 35 Issue: 6
- Vol: 35 Issue: 7
- Vol: 12 Issue: 1
- Vol: 12 Issue: 2
- Vol: 12 Issue: 3
- Vol: 12 Issue: 4
- Vol: 12 Issue: 5
- Vol: 12 Issue: 6
- Vol: 12 Issue: 7
- Vol: 12 Issue: 8
- Vol: 12 Issue: 9
- Vol: 12 Issue: 10
- Vol: 12 Issue: 11
- Vol: 12 Issue: 12
- Vol: PAMI-4 Issue: 1
- Vol: PAMI-4 Issue: 2
- Vol: PAMI-4 Issue: 3
- Vol: PAMI-4 Issue: 4
- Vol: PAMI-4 Issue: 5
- Vol: PAMI-4 Issue: 6
- Vol: PAMI-5 Issue: 1
- Vol: PAMI-5 Issue: 2
- Vol: PAMI-5 Issue: 3
- Vol: PAMI-5 Issue: 4
- Vol: PAMI-5 Issue: 5
- Vol: PAMI-5 Issue: 6
- Vol: PAMI-2 Issue: 1
- Vol: PAMI-2 Issue: 2
- Vol: PAMI-2 Issue: 3
- Vol: PAMI-2 Issue: 4
- Vol: PAMI-2 Issue: 6
- Vol: PAMI-3 Issue: 1
- Vol: PAMI-3 Issue: 2
- Vol: PAMI-3 Issue: 3
- Vol: PAMI-3 Issue: 4
- Vol: PAMI-3 Issue: 5
- Vol: PAMI-3 Issue: 6
- Vol: PAMI-8 Issue: 1
- Vol: PAMI-8 Issue: 2
- Vol: PAMI-8 Issue: 3
- Vol: PAMI-8 Issue: 4
- Vol: PAMI-8 Issue: 5
- Vol: PAMI-8 Issue: 6
- Vol: PAMI-9 Issue: 1
- Vol: PAMI-9 Issue: 2
- Vol: PAMI-9 Issue: 3
- Vol: PAMI-9 Issue: 4
- Vol: PAMI-9 Issue: 5
- Vol: PAMI-9 Issue: 6
- Vol: PAMI-6 Issue: 1
- Vol: PAMI-6 Issue: 2
- Vol: PAMI-6 Issue: 3
- Vol: PAMI-6 Issue: 4
- Vol: PAMI-6 Issue: 5
- Vol: PAMI-6 Issue: 6
- Vol: PAMI-7 Issue: 1
- Vol: PAMI-7 Issue: 2
- Vol: PAMI-7 Issue: 3
- Vol: PAMI-7 Issue: 4
- Vol: PAMI-7 Issue: 5
- Vol: PAMI-7 Issue: 6
- Vol: 10 Issue: 1
- Vol: 10 Issue: 2
- Vol: 10 Issue: 3
- Vol: 10 Issue: 4
- Vol: 10 Issue: 5
- Vol: 10 Issue: 6
- Vol: 11 Issue: 1
- Vol: 11 Issue: 2
- Vol: 11 Issue: 3
- Vol: 11 Issue: 4
- Vol: 11 Issue: 5
- Vol: 11 Issue: 6
- Vol: 11 Issue: 7
- Vol: 11 Issue: 8
- Vol: 11 Issue: 9
- Vol: 11 Issue: 10
- Vol: 11 Issue: 11
- Vol: 11 Issue: 12
The IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) is published monthly. Its editorial board strives to present most important research results in areas within TPAMI's scope.
Latest Published Articles
-
Higher Order Partial Least Squares (HOPLS): A Generalized Multilinear Regression Method
Zhao, Qibin ; Caiafa, Cesar F. ; Mandic, Danilo P. ; Chao, Zenas C. ; Nagasaka, Yasuo ; Fujii, Naotaka ; Zhang, Liqing ; Cichocki, AndrzejMay-16 2013 -
Color Invariants for Person Reidentification
May-16 2013 -
Automatic Relevance Determination in Nonnegative Matrix Factorization with the $(beta)$-Divergence
May-16 2013 -
Parsing Facades with Shape Grammars and Reinforcement Learning
May-16 2013 -
Low-Rank Matrix Approximation with Manifold Regularization
May-16 2013
Popular Articles
-
A Computational Approach to Edge Detection
Jan-27 2009 -
Robust Face Recognition via Sparse Representation
Dec-30 2008 -
Statistical pattern recognition: a review
Aug-06 2002 -
A performance evaluation of local descriptors
Aug-22 2005 -
Image Denoising Using the Higher Order Singular Value Decomposition
Feb-15 2013
Publish in this Journal
Meet Our Editors
Editor-in-Chief
Prof. Ramin Zabih
Cornell University
IEEE Access
Computational Intelligence and AI in Games, IEEE Transactions on
Computational Intelligence Magazine, IEEE
Popular Articles (March 2013)
Includes the top 25 most frequently downloaded documents for this publication according to the most recent monthly usage statistics.Society Sponsor
-
-
-
3. Statistical pattern recognition: a review
|
PDF (1708 KB)
-
-
-
6. Feature selection based on mutual information criteria of max-dependency, max-relevance, and min-redundancy
|
PDF (1265 KB)
-
-
-
-
-
11. Multiresolution gray-scale and rotation invariant texture classification with local binary patterns
|
PDF (3163 KB)
-
-
-
-
-
-
-
-
19. Moving Object Detection by Detecting Contiguous Outliers in the Low-Rank Representation
|
PDF (1525 KB)
-
-
-
-
-
-
25. Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images
|
PDF (9193 KB)
Aims & Scope
The IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) is published monthly. Its editorial board strives to present most important research results in areas within TPAMI's scope.
Meet Our Editors
Editor-in-Chief
Prof. Ramin Zabih
Cornell University
Further Links
The IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) is published monthly. Its editorial board strives to present most important research results in areas within TPAMI's scope.
Aims & Scope
The IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) is published monthly. Its editorial board strives to present most important research results in areas within TPAMI's scope. This includes all traditional areas of computer vision and image understanding, all traditional areas of pattern analysis and recognition, and selected areas of machine intelligence. Areas of such machine learning, search techniques, document and handwriting analysis, medical image analysis, video and image sequence analysis, content-based retrieval of image and video, face and gesture recognition and relevant specialized hardware and/or software archictectures are also covered.
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=34 More »
Frequency: 12
ISSN: 0162-8828
Published by:
Subjects
- Bioengineering
- Computing & Processing (Hardware/Software)
Contacts
Assistant
TPAMI Transactions Assistant
IEEE Computer Society
PO Box 3014
Los Alamitos, CA 90720-1314 90720-1314 USA
tpami@computer.org
Editor-in-Chief
Prof. Ramin Zabih
Cornell University
rdz@cs.cornell.edu
About this Journal
Editorial Board
Content Announcements
Author Resources
Society Sponsor
Contacts
Editor-in-Chief
Prof. Ramin Zabih
Cornell University
