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0741-3106
Electron Devices
IEEE Electron Devices Society
IEEE Electron Device Letters
http://ieeexplore.ieee.org/servlet/opac?punumber=55
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IEEE Electron Device Letters was one of the most-cited journals, ranking number ten in electrical and electronics engineering in 2003, according to the annual Journal Citation Report (2003 edition) published by the Institute for Scientific Information. It comprises original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes. Items are restricted to three pages and appear, on average, two months after acceptance. Please send all papers to theIEEE/EDS Publications Office.
This publication publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanotechnology, optoelectronics, photovoltaics, power ICs and micro-sensors. Items are restricted to three pages and publication time is two months from the end of the month in which the manuscript is accepted, providing the author responds immediately to all communications.
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Editor-in-Chief
Yuan Taur
University of California at San Diego, ECE Dept.
La Jolla, CA 92093-0407, USA
Phone: +1 858 534 3816
Fax: +1 858 822 1247
Email: taur@ece.ucsd.edu
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Editorial Office
Mariola Piatkiewicz
IEEE/EDS Publications Office
Piscataway, NJ 08854, USA
Email: m.piatkiewicz@ieee.org
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