High-resolution OCDR for testing integrated-optical waveguides: dispersion-corrupted experimental data corrected by a numerical algorithm

A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric (OCDR) measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range. High-resolution OCDR measurements may be seriously impaired by dispersion effects in the waveguides under test and rugged source spectra. In the investigation (Ti:LiNbO/sub 3/ single-mode waveguide, 16 mm long; superluminescent diode source at lambda /sub 0/=820 nm) the spatial resolution progressively deteriorates along the waveguide by about one order of magnitude (from 6 to 60 mu m). The algorithm was applied to the experimental data and successfully removed the dispersive broadening of the signatures.<
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