MST probes for electromagnetic fields measurements for EMC applications

The use of modulated scattering technique (MST) probes for electromagnetic fields measurements for some EMC applications is proposed. The main advantage deriving from the use of this measurement technique is related to the very limited perturbations introduced by a MST based field probe in the electromagnetic field under measurement. In the paper the theoretical basis of the MST is briefly discussed and then two MST based experimental systems, devoted to field uniformity verification in TEM cells and to shielding effectiveness evaluation of enclosures, are described. Some experimental data obtained by using MST probes are presented and compared with data obtained by means of analytical formulations or by means of standard probes.