High frequency E-field probe

This paper describes the construction of a high frequency E-field probe produced using polymer thick film technology. The probe is the key element of a complex measurement system which examines the absorbed power caused by the electromagnetic field of cellular phone equipment. The measurement system meets the requirements of the CENELEC recommendations in this area. The probe measures magnitude of the high frequency E-field (in the range of GSM characteristic frequencies, 900/1800 MHz), converts it into a DC voltage, and transmits this voltage towards the next element of the measurement system. This paper shows the planning details of the probe, focusing on the fixing of electric parameters.