Microstructural characterization of YBa/sub 2/Cu/sub 3/O/sub 7- delta / thin films on SrTiO/sub 3/ using four-axis X-ray diffraction

Microstructural characteristics of YBa/sub 2/Cu/sub 3/O/sub 7- delta / thin films on SrTiO/sub 3/ have an important influence on their physical properties. Four-axis X-ray diffraction methods have been used to characterize textured and nontextured phases in several YBa/sub 2/Cu/sub 3/O/sub 7- delta / thin films deposited on single-crystal SrTiO/sub 3/. The type of epitaxial orientation of a- and c-axis textured films has been analyzed by tilting the specimen and observing the distribution of YBa/sub 2/Cu/sub 3/O/sub 7- delta /