DECOUPLE: defect current detection in deep submicron I/sub DDQ/

I/sub DDQ/ test concept for deep submicron (DSM) devices named DECOUPLE (Defect Current Observation Under the Proportion of intrinsic Leakage currents) is proposed. A new clustering method obtained two defect free groups from a production data set by abstracting from a signature of intrinsic leakage current that is independent of process variations. Possible pass/fail tests, diagnosis, and detection of parametric defect currents are discussed on the data set. Another example of the pass/fail tests on a second product is presented.