Immediate elimination of gross ESD failures in PLCC MECL product line through innovative techniques

Sudden gross ESD failures occurred on MECL 10 H 20 LDS PLCC devices. This affected the yield with deterioration by 22/spl times/ and electrical AOQ from permanent six-sigma to 170/spl times/. These problems influenced the cycle time, with rapid deterioration; as a result, the whole manufacturing process of 10 H devices was suspended. Through charge mapping, statistical experiments, and innovative techniques, the process inducing ESD damage was narrowed down and the root cause immediately corrected. This resulted in the fast restoration of the PLCC 10 H assembly and test operation.