Case Study of Resistor Failure Caused by Bi Migration and Preventive Measures

In this paper, a case in which Bi migration leads to the failure of the chip resistor was analyzed, the source of Bi has been studied, and the analysis process of failure mode and failure mechanism were summarized. Migration of reduced isolation constituents (MRIC) model was described briefly. The preventive measures of the corresponding failure modes were also suggested in this paper.