Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM's

Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some important issues remain to be clarified in neutron-induced SE phenomena. This letter reports the geometric effect of multiple-bit SE's induced by neutrons. Multiple-bit SE's in 16 Mb DRAM's are investigated and their geometric effects on high reliability systems are discussed.