Research on the optimization method for high yield of low power circuit

As lower power requirements become more important and processes become more complex [1], the circuit is more and more affected by the process variation. The purpose of this paper is to research the optimization of low power circuits with high yield. We optimize a standard bandgap topology in 55 nm process technology in order to provide stable output voltage with minimal sensitivity to temperature, process variation and mismatch as the bandgap works in near-threshold field. Firstly, the priority of the circuit performance is determined. Then, the sensitivity of the performance to the device is analyzed. Lastly, the circuit parameters are adjusted by comprehensive consideration. After optimization, the average power of bandgap is only 300nA, with lower power requirements and higher yield. These findings are confirmed through Monte Carlo simulation and measured circuit data.