Statistical Analysis of Degradation Data for c-Si modules observed in India in 2016

This paper presents statistical analysis of power degradation rates of the PV modules inspected during the All India Survey of Photovoltaic Module Reliability 2016. Our analysis shows that there is a significantly higher probability of degradation rate being above 1%/year in the Hot zone as compared to the Non-hot zone, and similarly in the rooftop systems as compared to the ground mounted systems. Statistical analysis confirms that young modules are degrading at a faster rate than the old modules. However, the system size does not seem to affect the degradation rate for crystalline silicon modules.