Detecting Fault Injection Attacks Based on Compressed Sensing and Integer Linear Programming

Cryptographic ICs have been widely applied to numerous security-critical environments nowadays. Fault injection has become a serious attack on cryptographic IC, especially soft-errors or single event upsets (SEUs) by fine-resolution fault injection attacks. Detection and tamper evidence of these attacks become important. Traditional SEU diagnose methods usually require special sensors embedded into the circuits. However, these methods require non-trivial design and test effort, and usually just yield statistic results. In this paper, we formulate the detection fault injection attacks as a compressed sensing problem, due to sparsity of soft errors. Besides, due to the binary characteristic of the coefficient matrix and the variables, integer linear programming is adopted to reconstruct the soft error signals. Simulation results on a cryptographic IC demonstrate that the proposed method is capable to accurately detect the locations of soft-errors caused by fault injection attacks with negligible hardware overhead. The abnormal test output of scan-chains can be tamper evidence of the fault injection attacks.