High throughput multiple device diagnosis system

Volume Diagnosis is a proven methodology to significantly improve the yield enhancement rates. One of the key factors of success to this methodology is being able to perform diagnosis on hundreds to thousands of failing dies using a limited amount of computational resource in a tractable time. This paper presents a new Multiple Device Diagnosis (MDD) system to significantly improve the throughput of volume diagnosis by performing logic diagnosis on a group of failing devices. Experiments conducted on large industrial designs with randomly selected groups of failing devices demonstrated up to 12X increase in speed-up with the proposed system.