Quantitative analysis of diagnosis errors in the models of electronics preventive maintenance processes

In the paper, a method for the estimation of type I and type II errors of the built-in diagnostic hardware depending on the preventive maintenance periodicity is proposed. The approach considers an operational process of electronics as a Semi-Markov process with states of hazardous, latent and fictitious failures. The derived expressions may be used for the evaluation and analysis of the mentioned characteristics of builtin diagnostic devices.