Refractive index sensing using all-dielectric metasurface with analogue of electromagnetically induced transparency

In this paper, we design an all-dielectric metasurface, which can produce a sharp transmission peak due to analogue of electromagnetically induced transparency to realize refractive index sensing. The structure is a periodic lattice of a silicon dumbbell-shaped bar and a silicon ring resonator on the bulk fused silica substrate. The EIT phenomenon of the proposed metasurface and the refractive index sensing are both investigated using the finite integral method. The simulated results show the sensitivity to the refractive index reaches 2356.59 nm/RIU in the mid-infrared wavelength band.