On an effective selection of IDDQ measurement vectors for sequential circuits

In IDDQ testing, it is important to reduce the number of time-consuming IDDQ measurements. Therefore, it is necessary to select a small number of IDDQ measurement vectors in a test sequence for a sequential circuit while fault coverage is nearly maximum. In this paper, we address the selection problem of measurement vectors by introducing a cost function which is defined by the number of measurement vectors and fault coverage. The proposed method for selecting measurement vectors optimizes the cost function so that high fault coverage is obtained by a small number of measurement vectors.