Trapezoidal characterization of magnetic materials with a novel dual voltage test circuit

Magnetic Core Characterization is returning as a critical area of research. This is due in part to the rise of wide bandgap semiconductors that have enabled new applications, new converter topologies and system designs that are pushing the limits of passive components. Similarly, new core materials are opening design spaces previously unfilled by legacy cores. With all of these new opportunities, it is important to fully understand the magnetic core behavior within a wide operating window. This will enable a better understanding of the materials and better approaches that leads to more globally optimized designs. This paper demonstrates core material characterizations utilizing a new test circuit. It focuses on the excitation profiles of magnetic devices, inductors and transformers, typically utilized in dual and multi-port active bridges. However, the presented characterization methods are applicable to a wide variety of power converter topologies and applications.