An Analog-to-Digital converter immunity modeling based on a stochastic approach

This paper deals with the immunity study of a 12-bits SAR (Successive Approximation Register) Analog-to-Digital converter from Analog Devices facing to an EM (ElectroMagnetic) disturbance. The RF (Radio Frequency) disturbances are injected through the V
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pin of the studied component and its behavior is modeled. Due to the dispersion of conversion results, the approach proposed here is based on a stochastic modeling. The identification of the statistical distributions, describing the behavior of the disturbed component, is performed using the Akaike information criterion. Modeling results are compared to DPI (Direct Power Injection) measurements.