An efficient, low-cost ECC approach for critical-application memories

Multiple Cell Upsets (MCUs) induced by ionizing radiation in memories are becoming more likely to happen due to the continuous technology scaling down. Error Correction Codes (ECCs) are applied for recovering the stored information into its original state providing reliable computer systems. Several ECC are able to deal with MCUs, however, the higher the robustness of an ECC, more area, and energy is required for its implementation, becoming a problem if applied in application where resources are scarce. This article presents the implementation and evaluation of the Matrix Region Section Code (MRSC), a new algorithm for the detection and correction of multiple transient faults in volatile memories with low cost implementation. The experimental results measuring error coverage composed by detection and correction analysis, area, power and delay overheads have shown that MRSC is an excellent option to counteract with MCUs.