Realizing variations in performance and scalability via technology integration and new development

It is important to allow the test engineer great flexibility when developing a test program. Highly skilled test engineers desire flexibility and different hardware platforms to test a Unit Under Test (UUT). In the past, the engineer was told to use specific test equipment and not provided with the option to program an instrument to their specific test and diagnostic plans. Being stuck in a rut on our test technology has always been an area of concern. There are many ways to approach a test and sometimes circumstances dictate unique approaches to solve specific problems such as No-Fault-Found or diagnostic weaknesses. High Performance characteristics are Scalable, Full Dynamic Performance Configurable and have a common core Software Suite. PXI systems are flexible and you can add capability. PXI has become a dominant industry standard for measurement and automation applications. PXI is established with High Performance like High Data Transfer Rates, Small Rugged Industrial Footprint, and an Open Standard with Multiple Vendors. PXI has Innovative Technologies including Boundary Scan/JTAG, FPGA and high I/O Dynamic Digital. PXI based Automatic Test Equipment (ATE) is quickly becoming very practical. Inserting non-ATLAS applications into an ATLAS test program can be commonplace. Developing a digital test utilizing a PXI FPGA is a practical approach to utilizing technology. The FPGA can be programmed on a step by step approach. Each step can be independent or dependent. Interactive diagnostics is achievable by utilizing ATLAS in conjunction with specific applications. Pattern failures can be passed to the diagnostic routine for processing and patterns failures can be tested for a certain state during probing. FPGA modules can adapt their functionality on the fly. Systems can partially reconfigure an FPGA while the module is running to change its behavior in response to incoming signals this includes altering test vectors to more extensively test functions that appear marginal. New techniques needed include test hardware performance (although this continues to evolve with great improvements), software test techniques, and the long term support. Long term support is being addressed with the advent of true open systems which highlight improvement in flexibility and scalability. The practical application for this approach is downsizing test equipment, using state-of-the-art technology and improving test time. Test Program Set (TPS) development is constantly under scrutiny and process improvement. The type of scrutiny taking place is the inclusion of new hardware and software techniques to improve NFF rates, diagnostics and test time. We need to improve the TPS development time and the quality of our TPSs. Also, utilizing multiple languages proves the open architecture is valid and practical. This paper discusses the development, integration and characteristics of state-of-the-art systems. Discussed is the wide range of flexibility or scalability, utilizing integration of devices and techniques, latest technology use, expanding your capability, true open system concepts, scalable system applications and how to start out small and grow to a greater test capability.