An All-Region I–V Model for 1-D Nanowire MOSFETs

An all-region short-channel MOSFET, model is developed for nanowire semiconductors with 1-D density of states. It is shown that in the quantum capacitance limit, the long-channel saturation current exhibits a (V
_gs
- V
_t
)
^3/2
dependence on gate voltage. With the velocity saturation effect implemented in the model, the I
_ds
-V
_gs
characteristics of 1-D MOSFETs are compared to those of 2-D MOSFETs at 10-nm channel length. The above threshold model is joined with a subthreshold current model derived from short-channel solutions to form an I-V model continuous in all regions.