LEMMA-ADC: the linear error mechanism modelling algorithm applied to A/D-converters

Shows that the LEMMA model development approach can be extended beyond DACs. For the chosen ADC, we have demonstrated that the LEMMA method can cut the test time for the (all codes testing) histogram method by reducing the required number of hits per code by a factor of two, without reducing the accuracy of the INLresult. We have also demonstrated LEMMA's potential to save test time by using a short-codes test.