Adaptive accelerated aging with 28nm HKMG technology

Device and circuit reliability analysis lacks a direct validation of the lifetime. Usually, aging in devices is extrapolated from a short-term measurement, resulting in unreliable prediction of the end of lifetime (EOL). This work aims at providing a new approach to test the device to the end of lifetime in a fast and controllable manner. The contributions of this work include: (1) Introducing a test methodology called Adaptive Accelerated Aging (AAA), (2) Providing test conditions for multiple stress conditions, including those for achieving EOL in 1 hour, and (3) Presenting simulation and test results at 28nm to validate the proposed methodology.