Deterministic Methodology for Electrical Simulation of BTI Induced Pulse Broadening

This paper presents an analysis of the bias temperature instability (BTI) induced pulse broadening of single event transients (SETs) in inverter chains. A novel deterministic simulation methodology for BTI, using the trapping/de-trapping framework, is proposed and implemented in a commercial SPICE tool. The developed simulator properly predicts the possibility that an SET pulse may suffer propagation-induced pulse broadening (PIPB). The PIPB was analyzed in terms of supply voltage and input signal frequency. The simulations results are in agreement with experimental results from the literature.