Scattering center determination for integrated antenna measurements at mm-wave frequencies

In this paper the results of integrated antenna measurements are analyzed to identify the main reflection locations when measuring with wafer probes. Two different approaches are described and the measurement results for two different probe designs are shown. First, the main reflection center on the wafer probe is determined by analyzing the measured far field radiation pattern at 160 GHz. The second approach is based on an extrapolation measurement of the antenna. It is shown that the reflective areas can be identified for both probe designs. The results can be used to assess the measurement uncertainty and to quantify the measurement error.