An Electromagnetic imaging technique for Reverse Engineering of Integrated Circuits

The ElectroMagnetic (EM) imaging of Integrated Circuits (ICs) is often associated to the Near Field Scan to study the EM field of ICs surfaces. The goal is to draw a cartography of the EM field radiated by the Device Under test (DUT). In this paper we introduce a non intrusive and destructive EM imaging technique to understand operation or to disclose physical details about the inner structures of DUT. This technique called Electric Analysis of Voltage Pulse Propagation is developped and tested on a FPGA to reveal the top level power/ground distribution of IC.