System reliability estimation of high power diode laser with hypo-exponential distribution

This paper presents the model to estimate the reliability of high power diode laser system based on failure rate of each diode. The diodes' reliability is estimated from multi-cell life test with accelerated optical power and junction temperature. The system is then considered as a k-out-of-n:G load sharing system. The hypo-exponential distribution is applied to model the system level reliability. Two solutions to hypo-exponential model are introduced to compute the reliability at expected time and two examples are presented to illustrate the model. The numerical examples verify that the scaling and squaring method is more stable than exact algorithm considering numerical instability. Estimating with the hypo-exponential model, the single emitter diode laser system shows reliability higher than 0.999 at the lifetime required by customer.