Dielectric behavior of quenched PLZT 7/70/30 ceramics

The dielectric properties of PLZT 7/70/30 ceramics quenched and annealed at 350/spl deg/C were measured at temperatures from room temperature to 200/spl deg/C. It is found that the temperature (T/sub m/) of the dielectric constant maximum is nearly independent of the thermal treatment. The master curve behavior for the temperature dependence of the dielectric constant is discussed. All the results indicate that the dielectric behavior of PLZT-type relaxors is different from that of PMN-type relaxors. For a quenched sample, a very high dielectric loss which decays with time, is observed at the moment the sample is quenched to room temperature.