Imaging of ferroelectric domains with sub micrometer resolution by scanning force microscopy

A new method allowing the measurement of all three components of the spontaneous polarization at sample surfaces with a scanning force microscope is presented. This non-destructive technique offers a sub micrometer lateral resolution for the spontaneous polarization with simultaneous imaging of the surface morphology. The spontaneous polarization is made visible via the inverse piezoelectric effect: an a.c. voltage applied to the conductive tip of the scanning force microscope leads to a periodic local distortion of the crystal which is sensed by the tip. The method is demonstrated for barium-titanate crystals.