Towards an automated and reusable in-field self-test solution for MPSoCs

Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.