Error Analysis for Near-Field EMC Problems Based on Multipolar Expansion Approach

Devices using power electronics are ubiquitous today and they are unfortunately intrinsic sources of electromagnetic interference. To address these electromagnetic compatibility problems at the initial design phase, a predictive method based on multipole expansion in spherical harmonics of the near field around each device was developed. To determine the basic expansions of a given source, a dedicated measurement bench has been designed. In this paper, some important issues of this approach and the measurement bench are studied, especially the error analysis on the measurements and the inverse problems. Some experimental results are also shown in the end.