An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production

100-Gb/s optical interconnection devices are expected to be deployed widely in large scale datacenters. In order to improve the productivity of these optical devices, this paper proposes a test solution equipped with 16-lanes of 28-Gb/s both optical and electrical interfaces. In addition to these high-speed ports to test the devices, the test solution also includes device fixture technology which provides stable and repeatable insertion loss for more than 100,000 repeated plug/unplug operations. This test solution can be applied to high speed optical interconnection device testing in high volume manufacturing.