A built-in current sensor for testing analog circuit blocks

A built-in current (BIC) sensor circuit is proposed for supply current (I/sub DD/) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the I/sub DD/ path. The circuit has been implemented using a standard 0.5 /spl mu/m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included.