Measurement and Wigner function analysis of field-field correlation for complex PCBs in near field

The radiation from complex PCBs can be characterized through a statistical approach involving the field-field correlation. A two-probe measurement technique is developed to measure the stochastic electromagnetic (EM) emission from an Arduino Galileo board in an enclosure in the time domain at two different heights. The Wigner distribution function, which is a representation in phase space, is used to understand the mechanics of near field emissions. The evolution of the field-field correlation function and Wigner function is observed for both measurements. These results serve as a proof of principle for understanding that Wigner Function is a good candidate to understand whether the concept of radiation pattern can be extended to near field.