Thermally stimulated current measurements on PTFE electrets

Important in any practical use of electrets is the charge retention time and therefore device lifetime. Since charge retention times are on the order of years for many electret materials, accelerated tests are used where the driving force is increased temperature. In this preliminary study, three tests were used all using elevated temperatures: short-circuit thermally stimulated current measurements (short-circuit TSCs), open-circuit thermally stimulated current measurements (open-circuit TSCs), and isothermal charge decay measurements. These three techniques offer different perspectives of studying charge movement.